Time-Multiplexed 1687-Network for Test Cost Reduction-Reference-Cited by-同舟云学术

Time-Multiplexed 1687-Network for Test Cost Reduction

Published:2018-08 Issue:8 Volume:37 Page:1681-1691
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Ansari Muhammad Adil^ORCID,Jung Jihun^ORCID,Kim Dooyoung,Park Sungju^ORCID

Funder

Higher Education Commission, Pakistan

National Research Foundation of Korea

Ministry of Trade, Industry and Energy

Korea Semiconductor Research Consortium support program for the development of the future semiconductor device

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

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