Author:
Su Chaochin,Dai Zi-Guo,Lee Gang Ho,Vernon Matt
Abstract
ABSTRACTMolecular chlorine is scattered from a GaAs(100) surface and the reaction products detected by a mass spectrometer. A careful analysis of the velocity and angular distributions of the reaction products as well as the vibrational energy dependence of the daughter ion fragmentation pattern shows that the steady state reaction is stoichiometric in the removal of Ga and As until the incongruent evaporation rate exceeds the etch rate induced by the incident chlorine flux. The depletion of the nonreactive molecular chlorine signal is accounted for by the flux of chlorinated reaction products. The absolute etch rates as well as the incident chlorine flux are determined from the known evaporation rate of GaAs at the incongruent evaporation temperature. Modulated molecular beam scattering is used to establish some necessary reaction steps.
Publisher
Springer Science and Business Media LLC
Reference3 articles.
1. Observation of competing arsenic removal channels in the Cl2+GaAs reaction
2. The evaporation of GaAs under equilibrium and non-equilibrium conditions using a modulated beam technique
3. 2. Hou H. , Su C. , Lee G. , Dai Z. , M Vernon . , “Identification of the Volatile Reaction Products of the C12(g) + GaAs(s) Etching Reaction”, submitted to J. Vac. Sci. Technol.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献