Optoelectronic Performance Variations in InGaN/GaN Multiple-Quantum-Well Light-Emitting Diodes: Effects of Potential Fluctuation
Author:
Publisher
MDPI AG
Subject
General Materials Science
Link
http://www.mdpi.com/1996-1944/11/5/743/pdf
Reference51 articles.
1. Semiconductor ultraviolet detectors
2. Back-illuminated GaN/AlGaN heterojunction photodiodes with high quantum efficiency and low noise
3. The Roles of Structural Imperfections in InGaN-Based Blue Light-Emitting Diodes and Laser Diodes
4. Origin of defect-insensitive emission probability in In-containing (Al,In,Ga)N alloy semiconductors
5. On the reliable analysis of indium mole fraction within InxGa1−xN quantum wells using atom probe tomography
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Optimizing performance and energy consumption in GaN(n)/InxGa1-xN/GaN/AlGaN/GaN(p) light-emitting diodes by quantum-well number and mole fraction;Digest Journal of Nanomaterials and Biostructures;2023-12-20
2. Temperature-Dependent Efficiency Droop in GaN-Based Blue Micro Light-Emitting Diodes;ECS Journal of Solid State Science and Technology;2023-12-01
3. Determining the Turn-On Voltage of GaN-Based Light-Emitting Diodes: From Near-Ultraviolet to Green Spectra;ECS Journal of Solid State Science and Technology;2023-12-01
4. Tailoring optoelectronic properties of InGaN-based quantum wells through electric field, indium content, and confinement shape: A theoretical investigation;Physica B: Condensed Matter;2023-08
5. Intrasubband-related linear and nonlinear optical absorption in single, double and triple QW: the compositions, temperature and QW’s number effects;Philosophical Magazine;2022-12-23
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3