Author:
Wendt M.,Krajewski Th.,Bimberg R.
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. in: Characterization of Solid Surfaces, Ed. and , Plenum Press, New York/London 1974.
2. Electron probe microanalysis
3. and , Electron Beam Microanalysis, Amer. Soc. for Testing and Materials – Special Techn. Publ. No. 506, Philadelphia 1972.
4. The determination of thin layer thicknesses with an electron microprobe
5. Use of electron microprobe analysis to determine layer thicknesses down to the monolayer range
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