Electron probe microanalysis of thin films at variable angle of incidence-Reference-Cited by-同舟云学术

Electron probe microanalysis of thin films at variable angle of incidence

Published:1991 Issue:3 Volume:340 Page:193-196
ISSN:0937-0633
Container-title:Fresenius' Journal of Analytical Chemistry
language:en
Short-container-title:Fresenius J Anal Chem

Author:

Wendt M.

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Analytical Chemistry,Biochemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00324483.pdf

Reference7 articles.

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2. Duncumb P (1971) Electron microscopy and analysis, Nixon WC (ed), Institute of Physics, London, p 132

3. Pouchou JL, Pichoir F, Boivin D (1989) Proc. 12th Int. Congress on X-ray Optics and Microanalysis, Jasienska S, Maksymowicz LJ (eds), Cracow, Vol. I, p 52

4. Sewell PB, Mitchell DF, Cohen M (1969) Developments in applied spectroscopy, Grove EL, Perkins AJ (eds), Plenum Press, New York, Vol. 7A, p 61

5. Ino S, Ichikawa T, Okada S (1980) Jpn J Appl Phys 19:1451

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