Thin film analysis by x-ray microanalysis using gaussian Φ (ρ z) curves-Reference-Cited by-同舟云学术

Thin film analysis by x-ray microanalysis using gaussian Φ (ρ z) curves

Published:1988 Issue:2 Volume:10 Page:65-72
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Hunger H.-J.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950100203/fullpdf

Reference31 articles.

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2. Berger MJ Seltzer SM Tables of energy losses and ranges of electrons and positrons Nucl Ser Rep 1964 205 268

3. Bishop HE A simple method for estimating the thickness and composition of surface films in the electron probe x-ray microanalysis Aere Rep 7158 1972

4. Bremsvermögen von Atomen mit mehreren Elektronen;Bloch;Z Physik,1933

5. Quantitative electron probe microanalysis using Gaussian ϕ (ż) curves;Brown;X-ray Spectrom,1982

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