1. Absolutbestimmung der Dicke und Zusammensetzung von Oberfl�chenschichten mit der Mikrosonde
2. Electron Probe Microanalysis of Thin Layers and Small Particles with Emphasis on Light Element Determinations, Communication of the Hasler Research Center, Appl. Res. Lab., Inc., Goleta (Calif.).
3. Interaction of Electron Beams with Thin Films, in: Physics of Thin Films, Academic Press, New York & London 1964 (p. 64).
4. Interaction of Electron Beams with Thin Films, in: Physics of Thin Films, Academic Press, New York & London 1964 (p. 68).
5. Electron Probe Microanalysis