Surface to surface transition probabilities in thin film capacitors
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Introduction to Solid State Physics 2nd edition, Wiley, New York 1956 PP. 177, 486
2. Instability in vacuum deposited silicon oxide
3. Dispersion characteristics of thin films capacitances caused by surface trapping
4. Time constant of the voltage step response in thin film capacitors
5. Statistics of the Recombinations of Holes and Electrons
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3. Time constant of the ion current in thin film capacitors;Physica Status Solidi (a);1977-12-16
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