The influence of the electronic current on the measurement of ion polarization in evaporated silicon oxide
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference33 articles.
1. Influence of mobile ions on the electronic conduction in silicon oxide films;De Mey;Thin Solid Films,1974
2. Dielectric properties of thin films of aluminium oxide and silicon oxide;Argall;Thin Solid Films,1968
3. The ionic conductivity in silicon oxide films;Navik;Thin Solid Films,1970
4. Charge storage in evaporated silicon oxide films;Howson;Thin Solid Films,1970
5. Study of low frequency relaxation phenomena in thin film capacitors;De Wilde;Appl. Sci. Res.,1976
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Interfacial properties of metal-silicon oxide-metal structures in relation to the non-stoichiometry of a thin film dielectric;Thin Solid Films;1980-04
2. Capacitors;Microelectronic Packaging;1979
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