Time constant of the voltage step response in thin film capacitors
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Dielectric properties of thin films of aluminium oxide and silicon oxide
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3. Dielectrics, Science Paperbacks, London 1967 (p. 70).
4. Poole-Frenkel Effect and Schottky Effect in Metal-Insulator-Metal Systems
5. Apparatus to measure thin-film capacitors in the frequency range 0.0075-700Hz
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1. Time constant of the ion current in thin film capacitors;Physica Status Solidi (a);1977-12-16
2. The influence of the electronic current on the measurement of ion polarization in evaporated silicon oxide;Thin Solid Films;1977-04
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