Sensitivity of plane wave topography to microdefects
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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2. X-ray topographic investigation of large oxygen precipitates in silicon;Journal of Alloys and Compounds;2004-01
3. High-resolution X-ray topography;Applied Physics A Solids and Surfaces;1994-03
4. X-ray plane wave topography of annealed silicon crystals using asymmetric reflections;Physica Status Solidi (a);1993-07-16
5. Nature of dislocations promoting growth in liquid phase epitaxy of gallium arsenide;Journal of Crystal Growth;1993-06
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