Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science
Reference28 articles.
1. B.K. Tanner: X-Ray Diffraction Topography (Pergamon, Oxford 1976)
2. B.K. Tanner, D.K. Bowen (eds.): Characterization of Crystal Growth Defects by X-Ray Methods (Plenum, New York 1980)
3. A.R. Lang: J. Appl. Phys. 29, 597 (1958)
4. W. Berg: Naturwissenschaften 19, 391 (1931); Z. Kristallogr. 89, 286 (1931)
5. C.S. Barrett: Trans. AIME 161, 15 (1945)
Cited by
34 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献