Probing of Free Charge Carriers in Nanostructured Silicon Layers by Attenuated Total Reflectance Technique-Reference-Cited by-同舟云学术

Probing of Free Charge Carriers in Nanostructured Silicon Layers by Attenuated Total Reflectance Technique

Author:

Rodichkina Sofia P.¹²^ORCID,Nychyporuk Tetyana²,Pastushenko Anton²³,Timoshenko Victor Yu.¹⁴⁵

Affiliation:

1. Faculty of Physics, Lomonosov Moscow State University; Leninskie Gory 1 119991 Moscow Russia

2. Nanotechnology Institute of Lyon, University of Lyon; UMR CNRS 5270 INSA de Lyon F-69621 France

3. Apollon Solar SAS; 66 Course Charlemagne 69002 Lyon France

4. PhysBio Institute, National Research Nuclear University ‘MEPhI’ (Moscow Engineering Physics Institute); Kashirskoe sh. 31 115409 Moscow Russia

5. Lebedev Physical Institute of the Russian Academy of Sciences; Leninskiy Prospekt 53 119991 Moscow Russia

Funder

Ministry of Education and Science of the Russian Federation

MEPhI Academic Excellence Project

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

Reference23 articles.

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