Raman diagnostics of free charge carriers in boron‐doped silicon nanowires-Reference-Cited by-同舟云学术

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Raman diagnostics of free charge carriers in boron‐doped silicon nanowires

Published:2019-09-09 Issue:11 Volume:50 Page:1642-1648
ISSN:0377-0486
Container-title:Journal of Raman Spectroscopy
language:en
Short-container-title:J Raman Spectrosc

Author:

Rodichkina S.P.¹²^ORCID,Nychyporuk T.²,Pavlikov A.V.¹,Lysenko V.²³,Timoshenko V.Yu.¹³⁴

Affiliation:

1. Faculty of PhysicsLomonosov Moscow State University Moscow Russia

2. Nanotechnology Institute of Lyon, UMR CNRS 5270, INSA de LyonUniversity of Lyon Lyon France

3. National Research Nuclear University ‘MEPhI' (Moscow Engineering Physics Institute)PhysBio Institute, Kashirskoe sh. 31 Moscow Russia

4. Lebedev Physical Institute of the Russian Academy of Sciences Moscow Russia

Publisher

Wiley

Subject

Spectroscopy,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jrs.5702

Reference31 articles.

1. Metal-assisted chemical etching of silicon and nanotechnology applications

2. Effect of free charge carriers on birefringence and dichroism in anisotropic porous silicon layers

3. Enhanced thermoelectric performance of rough silicon nanowires

4. Nanowire Nanosensors for Highly Sensitive and Selective Detection of Biological and Chemical Species

5. Overview of semiconducting silicon nanowires for biomedical applications

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2. Achieving ultrahigh energy storage properties with superior stability in novel (Ba(1-)Bi )(Ti(1-)Zn0.5Sn0.5)O3 relaxor ferroelectric ceramics via chemical modification;Chemical Engineering Journal;2023-03

3. Hierarchical Hexagonal Boron Nitride Nanowall-Decorated Silicon Nanoparticles for Tunable Ink-Free Coloring;ACS Applied Nano Materials;2022-04-29

4. Effect of some physical perturbations and their interplay on Raman spectral line shapes in silicon: A brief review;Journal of Raman Spectroscopy;2021-11

5. Micro-Raman investigation of p-type B doped Si(1 0 0) revisited;Applied Surface Science;2021-09

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