Effect of some physical perturbations and their interplay on Raman spectral line shapes in silicon: A brief review-Reference-Cited by-同舟云学术

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Effect of some physical perturbations and their interplay on Raman spectral line shapes in silicon: A brief review

Published:2021-11 Issue:12 Volume:52 Page:2100-2118
ISSN:0377-0486
Container-title:Journal of Raman Spectroscopy
language:en
Short-container-title:J Raman Spectroscopy

Author:

Kumar Rajesh¹²³^ORCID,Tanwar Manushree¹^ORCID

Affiliation:

1. Materials and Device Laboratory, Department of Physics Indian Institute of Technology Indore Indore India

2. Centre for Advanced Electronics Indian Institute of Technology Indore Indore India

3. Centre for Indian Scientific Knowledge Systems Indian Institute of Technology Indore Indore India

Funder

Department of Science and Technology, Ministry of Science and Technology, India

Indian Institute of Technology Indore

Science and Engineering Research Board

Publisher

Wiley

Subject

Spectroscopy,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jrs.6272

Reference126 articles.

1. Asymmetry to symmetry transition of Fano line-shape: analytical description

2. Raman Spectroscopy of nanomaterials: How spectra relate to disorder, particle size and mechanical properties

3. Photoluminescence and Raman study of iron-passivated porous silicon

4. Electrochemical Control of Single-Molecule Conductance by Fermi-Level Tuning and Conjugation Switching

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1. Fano-type discrete-continuum interaction in perovskites and its manifestation in Raman spectral line shapes;Chemical Communications;2024

2. Exploring the potential of branched submicron channels-based structures in ultra-thin Ag films for SERS molecular sensing;Surfaces and Interfaces;2024-01

3. Effect of dimensionality on the excitation wavelength dependence of the Fano-Raman line-shape: a brief review;Nanoscale;2024

4. Asymmetric Silicon Dimers Made by Single‐Shot Laser‐Induced Transfer Demultiplex Light of Different Wavelengths;Advanced Optical Materials;2023-12-25

5. Verification of Si wafer first‐order phonon peaks for reliable calibration of Raman microscopes;Journal of Raman Spectroscopy;2023-11-27

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