A Janovec‐Kay‐Dunn‐Like Behavior at Thickness Scaling in Ultra‐Thin Antiferroelectric ZrO 2 Films-Reference-Cited by-同舟云学术

A Janovec‐Kay‐Dunn‐Like Behavior at Thickness Scaling in Ultra‐Thin Antiferroelectric ZrO 2 Films

Published:2021-09-12 Issue:11 Volume:7 Page:2100485
ISSN:2199-160X
Container-title:Advanced Electronic Materials
language:en
Short-container-title:Adv. Electron. Mater.

Author:

Tasneem Nujhat¹^ORCID,Yousry Yasmin Mohamed²,Tian Mengkun³,Dopita Milan⁴,Reyes‐Lillo Sebastian E.⁵,Kacher Josh⁶,Bassiri‐Gharb Nazanin²⁶^ORCID,Khan Asif Islam¹⁶

Affiliation:

1. School of Electrical and Computer Engineering Georgia Institute of Technology Atlanta GA 30332 USA

2. G.W. School of Mechanical Engineering Georgia Institute of Technology Atlanta GA 30332 USA

3. Institute for Electronics and Nanotechnology Georgia Institute of Technology Atlanta GA 30032 USA

4. Charles University Faculty of Mathematics and Physics Department of Condensed Matter Physics Ke Karlovu 5 Prague CZ‐121 16 Czech Republic

5. Departamento de Ciencias Físicas Universidad Andres Bello Santiago 837‐0136 Chile

6. School of Materials Science and Engineering Georgia Institute of Technology Atlanta GA 30332 USA

Funder

National Science Foundation

Defense Threat Reduction Agency

European Regional Development Fund

Fondo Nacional de Desarrollo Científico y Tecnológico

Publisher

Wiley

Subject

Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/aelm.202100485

Reference55 articles.

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4. M.Pesic S.Knebel M.Hoffmann C.Richter T.Mikolajick U.Schroeder in2016 IEEE International Electron Devices Meeting (IEDM) IEEE Piscataway NJ2016 pp.11.6.1–11.6.4.

5. Theory of Antiferroelectric Crystals

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