Defect Engineering for High Performance and Extremely Reliable a‐IGZO Thin‐Film Transistor in QD‐OLED
Author:
Affiliation:
1. Samsung Display Co., LTD. Giheung‐gu Yongin‐si Gyeonggi‐do 17133 Republic of Korea
2. Interdisciplinary Graduate Program for Artificial Intelligence Smart Convergence Technology Korea University Sejong 30019 Republic of Korea
Funder
Korea University
Publisher
Wiley
Subject
Electronic, Optical and Magnetic Materials
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/aelm.202101273
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