Silicon migration seal wafer‐level vacuum encapsulation
Author:
Affiliation:
1. Tohoku University 6‐6‐01, Aramaki‐aza‐Aoba, Aoba‐ku Sendai Miyagi 980–8579 Japan
2. INSA Lyon 20 Avenue Albert Einstein Villeurbanne cedex 69621 France
Publisher
Wiley
Subject
Applied Mathematics,Electrical and Electronic Engineering,Computer Networks and Communications,General Physics and Astronomy,Signal Processing
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/ecj.12283
Reference12 articles.
1. New Thin Film Epitaxial Polysilicon Encapsulation for Piezoresistive Accelerometers;Partridge A;Proc IEEE MEMS,2001
2. Long-Term and Accelerated Life Testing of a Novel Single-Wafer Vacuum Encapsulation for MEMS Resonators
3. Frequency stability of wafer-scale film encapsulated silicon based MEMS resonators
4. A Unified Epi‐Seal Process for Fabrication of High‐Stability Microelectromechanical Devices;Yang Y;J Microelectromech Syst,2016
5. Deposition of thick doped polysilicon films with low stress in an epitaxial reactor for surface micromachining applications;Kirsten M;Thin Solid Films,1995
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3. Investigation of Vapor HF Sacrificial Etching Characteristics Through Submicron Release Holes for Wafer-Level Vacuum Packaging Based on Silicon Migration Seal;Journal of Microelectromechanical Systems;2023-08
4. Mems Resonator Vacuum-Sealed by Silicon Migration and Hydrogen Outdiffusion;2023 IEEE 36th International Conference on Micro Electro Mechanical Systems (MEMS);2023-01-15
5. Characterization of Vapor HF Sacrificial Etching Through Submicron Relase Holes for Wafer-Level Vacuum Packaging Based on Silicon Migration Seal;2023 IEEE 36th International Conference on Micro Electro Mechanical Systems (MEMS);2023-01-15
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