A Study on Annealing Process Influenced Electrical Properties of Ni/CeO 2 /p‐Si/Al Schottky Barrier Diodes

Author:

Nallabala Nanda Kumar Reddy1,Kummara Venkata Krishnaiah2,Chinnappa Yuvaraj3,George P. P.4,Manjunath V.5ORCID,Sanniboina Jagadeesh6,Reddy S. Manikanteswara6,Gangasani Nethaji Reddy7

Affiliation:

1. Department of Physics Madanapalle Institute of Technology and Science Madanapalle Andhra Pradesh 517325 India

2. Department of Physics Rajeev Gandhi Memorial College of Engineering and Technology Nandyal Andhra Pradesh 518501 India

3. Department of Mechanical Engineering Madanapalle Institute of Technology & Science Madanapalle Andhra Pradesh 517325 India

4. Department of Chemistry Madanapalle Institute of Technology and Science Madanapalle Andhra Pradesh 517325 India

5. Department of Physics Sri Padmavati Mahila Visvavidyalayam (Women's University) Tirupati Andhra Pradesh 517502 India

6. Department of Electronics and communication Engineering Madanapalle Institute of Technology and Science Madanapalle Andhra Pradesh 517325 India

7. Department of Civil Engineering Madanapalle Institute of Technology and Science Madanapalle Andhra Pradesh 517325 India

Publisher

Wiley

Subject

Materials Chemistry,Polymers and Plastics,Organic Chemistry,Condensed Matter Physics

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