Analysis of liquid materials in low vacuum with Wet-SIMS-Reference-Cited by-同舟云学术

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Analysis of liquid materials in low vacuum with Wet-SIMS

Published:2014-05-22 Issue:12-13 Volume:46 Page:1133-1136
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Seki Toshio¹²,Fujii Makiko³,Kusakari Masakazu¹,Nakagawa Shunichiro¹,Aoki Takaaki⁴²,Matsuo Jiro³²

Affiliation:

1. Department of Nuclear Engineering; Kyoto University; Uji 611-0011 Kyoto Japan

2. CREST; Japan Science and Technology Agency (JST); Chiyoda 102-0075 Tokyo Japan

3. Quantum Science and Engineering Center; Kyoto University; Uji 611-0011 Kyoto Japan

4. Department of Electronic Science and Engineering; Kyoto University; Nishikyo 615-8510 Kyoto Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference17 articles.

1. Micrometric molecular histology of lipids by mass spectrometry imaging

2. Tissue Molecular Ion Imaging by Gold Cluster Ion Bombardment

3. Molecular imaging of lipids in cells and tissues

4. Cluster primary ion bombardment of organic materials

5. Biological tissue imaging with time-of-flight secondary ion mass spectrometry and cluster ion sources

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1. Innovative Technologies in Advanced SIMS : Toward Organic and Biological Material Analysis;Vacuum and Surface Science;2021-10-10

2. MeV-SIMS measurement of lithium-containing electrolyte;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09

3. Secondary ion mass spectrometry measurements under ambient and humid conditions using MeV ions;Journal of Vacuum Science & Technology B;2020-05

4. Development of Low-vacuum SIMS instruments with large cluster Ion beam;Surface and Interface Analysis;2016-09-15

5. Development of ambient SIMS using mega-electron-volt-energy ion probe;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-05

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