1. 1) D. Briggs and M.P. Seah (Eds.) : “Practical Surface Analysis, Ion and Neutral Spectroscopy” (John Wiley & Sons, Inc., 1993) 表面分析 : SIMS—二次イオン質量分析法の基礎と応用, 志水 隆一, 二瓶 好正監訳 (アグネ, 1996).
2. 2) J.C. Vickerman and D. Briggs (Eds.) : “TOF-SIMS : Materials Analysis by Mass Spectrometry, 2nd Editon” (IM Publications, Chichester, 2013).
3. 3) C.M. Mahoney (Ed.) : “Cluster Secondary Ion Mass Spectrometry : Principles and Applications” (John Wiley & Sons, Inc., 2013).
4. 4) A. Benninghoven : Phys. Status Solidi 34, K169 (1969).
5. 5) A.M. Spool : “The Practice of Tof-sims : Time of Flight Secondary Ion Mass Spectrometry” (Momentum Press, 2016).