Secondary ion mass spectrometry measurements under ambient and humid conditions using MeV ions-Reference-Cited by-同舟云学术

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Secondary ion mass spectrometry measurements under ambient and humid conditions using MeV ions

Published:2020-05 Issue:3 Volume:38 Page:034014
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B
language:en
Short-container-title:Journal of Vacuum Science & Technology B

Author:

Seki Toshio¹,Ishii Kenta¹,Aoki Takaaki²,Matsuo Jiro³

Affiliation:

1. Department of Nuclear Engineering, Kyoto University, Gokasyo, Uji 611-0011 Japan

2. Academic Center for Computing and Media Studies, Kyoto University, Sakyo-ku, Kyoto 606-8501 Japan

3. Quantum Science and Engineering Center, Kyoto University, Gokasyo, Uji 611-0011 Japan

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.5145014

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A perspective on ToF-SIMS analysis of biosensor interfaces: Controlling and optimizing multi-molecular composition, immobilization through bioprinting, molecular orientation;Applied Surface Science;2022-08

2. Innovative Technologies in Advanced SIMS : Toward Organic and Biological Material Analysis;Vacuum and Surface Science;2021-10-10

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