X-band MMIC low-noise amplifier MMIC on SiC substrate using 0.25-μm ALGaN/GaN HEMT technology

Author:

Chang Woojin1,Jeon Gye-Ik1,Park Young-Rak1,Mun Jae-Kyoung1

Affiliation:

1. GaN Power Electronics Research Section, Components and Materials Research Laboratory; Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-Dong; Yuseong-Gu Daejeon Korea

Funder

“Energy Efficient Power Semiconductor Technology for Next Generation Data Center” IT R&D

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. On the recovery time of highly robust low-noise amplifiers;Liero;IEEE Trans. MTT,2010

2. W. Ciccognani E. Limiti P.E. Longhi C. Mitrano A. Nanni M. Peroni An ultrabroadband robust LNA for defense applications in AlGaN/GaN technology 2010 493 496

3. A. Bettidi F. Corsaro A. Cetronio A. Nanni M. Peroni P. Romanini X-band GaN-HEMT LNA performance versus robustness trade-off 2009 1792 1795

4. Wideband balanced AlGaN/GaN HEMT MMIC low noise amplifier;Seo;Electron Lett,2005

5. J.P.B. Janssen M. van Heijningen G.C. Visser M. Rodenburg H.K. Johnson M.J. Uren E. Morvan F.E. van Vliet Robust X-band LNAs in AlGaN/GaN technology Rome, Italy, 2009 101 104

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1. X-band Monolithic GaN HEMT LNA based on Indigenous Process;2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2024-03-03

2. Design ofGaN‐basedX‐band LNAsto achieve sub‐1.2 dBnoise figure;International Journal of RF and Microwave Computer-Aided Engineering;2022-09-06

3. GaN-based Single Stage Low Noise Amplifier for X-band Applications;2022 Microwave Mediterranean Symposium (MMS);2022-05-09

4. Design and robustness improvement of high‐performance LNA using 0.15 μm GaN technology forX‐band applications;International Journal of Circuit Theory and Applications;2022-04-19

5. Highly robust X‐band quasi circulator‐integrated low‐noise amplifier for high survivability of radio frequency front‐end systems;International Journal of Circuit Theory and Applications;2021-03-17

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