On the Recovery Time of Highly Robust Low-Noise Amplifiers-Reference-Cited by-同舟云学术

On the Recovery Time of Highly Robust Low-Noise Amplifiers

Published:2010-04 Issue:4 Volume:58 Page:781-787
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Liero Armin¹,Dewitz Mike²,kuhn Silvio¹,Chaturvedi Nidhi¹,Xu Jijun³,Rudolph Matthias⁴

Affiliation:

1. Ferdinand-Braun-Institut, Leibniz Insitut für Höchstfrequenztechnik (FBH), Berlin, Germany

2. Ferdinand-Braun-Institut, HTW Hochschule für, Leibniz Insitut für Höchstfrequenztechnik (FBH), Technik und Wirtschaft Berlin, University of Applied Sciences, Berlin, Berlin, Germany

3. Nanowave Techologies Inc, Etobicoke, Canada

4. Ferdinand-Braun-Institut, Ulrich-L.-Rohde Chair for RF and Microwave Techniques, Leibniz Insitut für Höchstfrequenztechnik (FBH), Brandenburg University of Technology, Berlin, Cottbus, Germany

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx5/22/5446455/05427096.pdf?arnumber=5427096

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