Author:
Pinault B.,Tartarin J.G.,Saugnon D.,Leblanc R.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Analysis of the survivability of GaN low-noise amplifiers;Rudolph;IEEE Trans. Microw. Theory Techn.,2007
2. Highly robust X-band LNA with extremely short recovery time;Rudolph,2009
3. On the recovery time of highly robust low-noise amplifiers;Liero;IEEE Trans. Microw. Theory Techn.,2010
4. X-band GaN-HEMT LNA performance versus robustness trade-off;Bettidi,2009
5. A new method for designing robust low noise amplifier;Bastien,2023