Accelerated Life Testing of One‐shot Devices
Author:
Publisher
Wiley
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/9781119664031
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Bayes analysis of one-shot device testing data with correlated failure modes using copula models;Communications in Statistics - Simulation and Computation;2023-12-07
2. Optimal test design for reliability demonstration under multi-stage acceptance uncertainties;Quality Engineering;2023-10-13
3. Robust estimation based on one-shot device test data under log-normal lifetimes;Statistics;2023-07-26
4. Step-stress tests for interval-censored data under gamma lifetime distribution;Quality Engineering;2023-04-21
5. Robust inference for nondestructive one‐shot device testing under step‐stress model with exponential lifetimes;Quality and Reliability Engineering International;2023-02-16
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