Robust estimation based on one-shot device test data under log-normal lifetimes-Reference-Cited by-同舟云学术

Robust estimation based on one-shot device test data under log-normal lifetimes

Published:2023-07-26 Issue:5 Volume:57 Page:1061-1086
ISSN:0233-1888
Container-title:Statistics
language:en
Short-container-title:Statistics

Author:

Balakrishnan N.¹^ORCID,Castilla E.²^ORCID

Affiliation:

1. Department of Mathematics and Statistics, McMaster University, Hamilton, Ontario, Canada

2. Departamento de Matematica Aplicada, Rey Juan Carlos University, Madrid, Spain

Publisher

Informa UK Limited

Subject

Statistics, Probability and Uncertainty,Statistics and Probability

Link

https://www.tandfonline.com/doi/pdf/10.1080/02331888.2023.2240925

Reference30 articles.

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2. So HY. Some inferential results for one-shot device testing data analysis [PhD thesis]. Hamilton Ontario Canada: McMaster University; 2016. http://hdl.handle.net/11375/19438.

3. Accelerated Life Testing of One‐shot Devices

4. Gart JJ Krewski D Lee PN et al. Statistical methods in cancer research. Vol. III The design and analysis of long-term animal experiments. 1986. p. 1–219. (IARC Scientific Publications; 79).

5. Statistical Analysis of HIV Infectivity Based on Partner Studies

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