Optimal test design for reliability demonstration under multi-stage acceptance uncertainties

Author:

Wang Bingjie1,Lu Lu2,Chen Suiyao1,Li Mingyang1

Affiliation:

1. Department of Industrial and Management Systems Engineering, University of South Florida, Tampa, Florida

2. Department of Mathematics and Statistics, University of South Florida, Tampa, Florida

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality

Reference29 articles.

1. Accelerated Life Testing of One‐shot Devices

2. Chen, S. 2020a. BRDT: Binomial Reliability Demonstration Tests. R Package Version 0.1.0. https://github.com/ericchen12377/BRDT

3. Chen, S. 2020b. Some recent advances in design of bayesian binomial reliability demonstration tests. Tampa, FL: University of South Florida.

4. Multi-state reliability demonstration tests

5. Optimal binomial reliability demonstration tests design under acceptance decision uncertainty

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