Bayes analysis of one-shot device testing data with correlated failure modes using copula models-Reference-Cited by-同舟云学术

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Bayes analysis of one-shot device testing data with correlated failure modes using copula models

Published:2023-12-07 Issue: Volume: Page:1-20
ISSN:0361-0918
Container-title:Communications in Statistics - Simulation and Computation
language:en
Short-container-title:Communications in Statistics - Simulation and Computation

Author:

Ashkamini ¹,Sharma Reema²,Upadhyay Satyanshu K.¹³

Affiliation:

1. DST-Centre for Interdisciplinary Mathematical Sciences, Banaras Hindu University, Varanasi, India

2. Department of Agricultural Engineering, Banaras Hindu University, Varanasi, India

3. Department of Statistics, Banaras Hindu University, Varanasi, India

Publisher

Informa UK Limited

Subject

Modeling and Simulation,Statistics and Probability

Link

https://www.tandfonline.com/doi/pdf/10.1080/03610918.2023.2288802

Reference33 articles.

1. Reliability modeling for systems subject to multiple dependent competing failure processes with shock loads above a certain level

2. Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data

3. A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks

4. EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution

5. Accelerated Life Testing of One‐shot Devices

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