GIMPy: a software for the simulation of X-ray fluorescence and reflectivity of layered materials-Reference-Cited by-同舟云学术

GIMPy: a software for the simulation of X-ray fluorescence and reflectivity of layered materials

Published:2017-01-25 Issue:2 Volume:46 Page:116-122
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Brigidi Fabio¹,Pepponi Giancarlo¹²

Affiliation:

1. Micro Nano Facility, Centre for Materials and Microsystems; Fondazione Bruno Kessler; 38123 Povo Trento Italy

2. Elettra-Sincrotrone Trieste S.C.p.A.; Basovizza 34149 Italy

Publisher

Wiley

Subject

Spectroscopy

Reference32 articles.

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3. Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis;Hönicke;Physica Status Solidi (a),2015

4. Comparison between some common influence coefficient algorithms;Willis;X-Ray Spectrometry,2004

5. How accurate is the fundamental parameter approach? XRF analysis of bulk and multilayer samples;De Boer;X-Ray Spectrometry,1993

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