Argon ions deeply implanted in silicon studied by Rutherford/Elastic Backscattering and Grazing Incidence X-ray Fluorescence spectroscopy-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Argon ions deeply implanted in silicon studied by Rutherford/Elastic Backscattering and Grazing Incidence X-ray Fluorescence spectroscopy

Published:2019-07 Issue: Volume:450 Page:144-148
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Kokkoris M.,Androulakaki E.G.,Czyzycki M.,Erich M.,Karydas A.G.,Leani J.J.,Migliori A.,Ntemou E.,Paneta V.,Petrović S.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference31 articles.

1. Ion Implantation and Synthesis of Materials;Nastasi,2006

2. Carrier activation in in situ Si-doped GaAs layers fabricated by a focused Si ion beam and molecular beam epitaxy combined system

3. Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

4. Thin film depth profiling by ion beam analysis

5. Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Depth profiling of energetic Au ions inside P-type Si 〈1 0 0〉 substrate;Applied Surface Science;2022-03

2. A mathematical model for deep ion implantation depth profiling by synchrotron radiation grazing-incidence X-ray fluorescence spectrometry;Journal of Analytical Atomic Spectrometry;2020

3. 2020 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications;Journal of Analytical Atomic Spectrometry;2020

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3