A combined X-ray, ellipsometry and atomic force microscopy study on thin parylene-C films-Reference-Cited by-同舟云学术

A combined X-ray, ellipsometry and atomic force microscopy study on thin parylene-C films

Published:2009-06-22 Issue:8 Volume:206 Page:1727-1730
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:phys. stat. sol. (a)

Author:

Flesch Heinz-Georg,Werzer Oliver,Weis Martin,Jakabovič Ján,Kováč Jaroslav,Haško Daniel,Jakopič Georg,Wondergem Harry J.,Resel Roland

Funder

Austrian Science Foundation within the RPC ISOTEC

Slovak Research and Development Agency

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.200881616/fullpdf

Reference10 articles.

1. Anomalies in the Optical Index of Refraction of Spun Cast Polystyrene Thin Films

2. Low-Operating-Voltage Organic Field-Effect Transistors with Poly-p-Xylylene/High-kPolymer Bilayer Gate Dielectric

3. Engineering the surface and interface of Parylene C coatings by low-temperature plasmas

4. Surface Studies of Solids by Total Reflection of X-Rays

5. Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates

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