Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD-PICTS) and microwave detected photoconductivity (MDP)-Reference-Cited by-同舟云学术

Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD-PICTS) and microwave detected photoconductivity (MDP)

Published:2011-01-31 Issue:4 Volume:208 Page:769-776
ISSN:1862-6300
Container-title:physica status solidi (a)
language:en
Short-container-title:phys. stat. sol. (a)

Author:

Berger Bastian,Schüler Nadine,Anger Sabrina,Gründig-Wendrock Bianca,Niklas Jürgen R.,Dornich Kay

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssa.201083994/fullpdf

Reference26 articles.

1. K. Dornich N. Schüler D. Mittelstraß A. Krause B. Gründig-Wendrock K. Niemietz J. R. Niklas Proceedings of the 24th European Photovoltaic Solar Energy Conference, Hamburg, Germany 2009 1106 1108

2. Non Destructive Electrical Defect Characterisation and Topography of Silicon Wafers and Epitaxial Layers

3. Iron and its complexes in silicon

4. Structure and transformation of the metastable boron- and oxygen-related defect center in crystalline silicon

5. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative Insight of Annealing Atmosphere-Induced Device Performance and Bias Stability in a Ga-Doped InZnSnO Thin-Film Transistors;IEEE Transactions on Electron Devices;2024-09

2. Quantitative analysis of defect states in InGaZnO within 2 eV below the conduction band via photo-induced current transient spectroscopy;Scientific Reports;2023-08-17

3. Quasi-monocrystalline silicon for low-noise end mirrors in cryogenic gravitational-wave detectors;Physical Review Research;2022-10-18

4. Deep levels related to the carbon antisite–vacancy pair in 4H-SiC;Journal of Applied Physics;2021-08-14

5. Optical–Microwave Pump–Probe Studies of Electronic Properties in Novel Materials;physica status solidi (b);2020-10-26