A robust focusing and astigmatism correction method for the scanning electron microscope-Part III: An improved technique
Author:
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.1998.4950200501/fullpdf
Reference5 articles.
1. A robust focusing and astigmatism correction method for the scanning electron microscope;Ong;Scanning,1997
2. A robust focusing and astigmatism correction method for the scanning electron microscope-Part II: Autocorrelation-based coarse focusing method;Ong;Scanning,1998
3. Eddy current compensation for magnetic electron lenses;Thong;Meas Sci Technol,1996
4. High-speed operation of scanning electron microscope lenses;Thong;Scanning,1997
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