An inference method for temperature step-stress accelerated life testing
Author:
Publisher
Wiley
Subject
Management Science and Operations Research,Safety, Risk, Reliability and Quality
Reference15 articles.
1. Accelerated Life Testing - Step-Stress Models and Data Analyses
2. Optimum Simple Step-Stress Plans for Accelerated Life Testing
3. Optimum simple step-stress accelerated life tests with censoring
4. A New Approach To Inference From Accelerated Life Tests
5. Inference for step-stress accelerated life tests
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1. Robust inference for nondestructive one‐shot device testing under step‐stress model with exponential lifetimes;Quality and Reliability Engineering International;2023-02-16
2. Robust Rao-Type Tests for Non-destructive One-Shot Device Testing Under Step-Stress Model with Exponential Lifetimes;Building Bridges between Soft and Statistical Methodologies for Data Science;2022-08-25
3. Bibliography;Accelerated Life Testing of One‐shot Devices;2021-02-26
4. Time and cost constrained design of a simple step-stress accelerated life test under progressive Type-I censoring;Quality Engineering;2020-09-04
5. Optimal design of a simple step‐stress accelerated life test under progressive type I censoring with nonuniform durations for exponential lifetimes;Quality and Reliability Engineering International;2019-07
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