Inference for step-stress accelerated life tests

Author:

Shaked Moshe,Singpurwalla Nozer D.

Publisher

Elsevier BV

Subject

Applied Mathematics,Statistics, Probability and Uncertainty,Statistics and Probability

Reference9 articles.

1. Bayesian estimation and optimal designs in partially accelerated life testing;DeGroot;Naval Res. Logistic Quart.,1979

2. A preliminary investigation of the steady and progressive stress testing of MICA capacitors;Endicott;Proc. 7th National Symposium on Reliability and Quality Control,1961

3. Shock models and wear processes;Esary;Ann. Probab.,1973

4. Reliability design qualification and production acceptance tests: exponential distribution,1977

5. Accelerated life testing — step stress models and data analyses;Nelson;IEEE Trans. Reliability,1980

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1. Tampered random variable modeling for multiple step-stress life test;Communications in Statistics - Theory and Methods;2021-12-02

2. Experimental reliability study of cumulative damage models on state-of-the-art semiconductor technologies for step-stress tests and mission profile stresses;Journal of Vacuum Science & Technology B;2020-11

3. Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests;Journal of Computational and Applied Mathematics;2017-02

4. Miscellaneous topics;Analysis of Step-Stress Models;2017

5. Bibliography;Analysis of Step-Stress Models;2017

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