Optimum simple step-stress accelerated life tests with censoring-Reference-Cited by-同舟云学术

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Optimum simple step-stress accelerated life tests with censoring

Published:1989 Issue:5 Volume:38 Page:528-532
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Bai D.S.,Kim M.S.,Lee S.H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx1/24/1755/00046476.pdf?arnumber=46476

Cited by 197 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bayesian estimation and prediction under progressive-stress accelerated life test for a log-logistic model;Alexandria Engineering Journal;2024-08

2. Statistical inference of a step-stress model with competing risks under time censoring for alpha power exponential distribution;Journal of Radiation Research and Applied Sciences;2024-03

3. Maximum Product of Spacings Estimator Under Type-I Censoring With an Application to a Step-Stress Model With Weibull Lifetimes;IEEE Transactions on Reliability;2024

4. Optimal test plans for accelerated life tests based on progressive type-I censoring with engineering applications;Alexandria Engineering Journal;2024-01

5. Estimation and prediction for proportional hazard family based on a simple step-stress model with Type-II censored data;ELECTRON J APPL STAT;2023

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