Robust Rao-Type Tests for Non-destructive One-Shot Device Testing Under Step-Stress Model with Exponential Lifetimes
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Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-15509-3_4
Reference5 articles.
1. Balakrishnan, N., Castilla, E., Jaenada, M., Pardo, L.: Robust inference for non-destructive one-shot devicetesting under step-stress model with exponential lifetimes. arXiv preprint, arXiv: 2204.11560 (2022)
2. Balakrishnan, N., Jaenada, M., Pardo, L.: The restricted minimum density power divergence estimator for non-destructive one-shot device testing the under step-stress model with exponential lifetimes. arXiv preprint, arXiv: 2205.07103 (2022)
3. Basu, A., Ghosh, A., Martin, N., Pardo, L.: A robust generalization of the Rao Test. J. Bus. Economic Stat. 40(2), 868–879 (2021)
4. Gouno, E.: An inference method for temperature step-stress accelerated life testing. Qual. Reliab. Eng. Int. 17(1), 11–18 (2001)
5. Jaenada, M., Miranda, P., Pardo, L.: Robust test statistics based on restricted minimum Rényi’s pseudodistance estimators. Entropy 24(5), 616 (2022)
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2. Robust Rao-Type Tests for Non-destructive One-Shot Device Testing Under Step-Stress Model with Exponential Lifetimes;Building Bridges between Soft and Statistical Methodologies for Data Science;2022-08-25
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