The Critical Voltage Effect in Transmission Electron Microscopy. VIII. The Qualitative Influence of Non-Systematic Reflections on the Critical Voltage-Reference-Cited by-同舟云学术

The Critical Voltage Effect in Transmission Electron Microscopy. VIII. The Qualitative Influence of Non-Systematic Reflections on the Critical Voltage

Published:1977-04-01 Issue:2 Volume:80 Page:477-490
ISSN:0370-1972
Container-title:Physica Status Solidi (b)
language:de
Short-container-title:Phys. Stat. Sol. (b)

Author:

David M.,Gevers R.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Etude en microscopie electronique·de 1'influence des reflexions accidentelles sur les tensions critiques

2. , and , in: High-Voltage Electron Microscopy 1973 , Ed. , and , Academic Press, London 1974 (p. 38).

3. The critical voltage effect in transmission electron microscopy. III. Influence of weak beams on degeneracy

4. and , in: Electron Microscopy 1976 , Vol. 1, Ed. Tal Internat. Publ. Co., Jerusalem 1976 (p. 291).

5. Bloch wave notation in many-beam electron diffraction theory

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1. Observation of Cr<111> zone-axis critical-voltage effect;Philosophical Magazine B;1987-01

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3. Multiple-beam dynamic effects in Kikuchi patterns obtained at very high voltages in electron microscopy;Philosophical Magazine A;1978-11

4. The Critical Voltage Effect in Transmission Electron Microscopy. X. Experimental Observatisons in the Presence of Non-Systematic Reflections;Physica Status Solidi (b);1978-06-01

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