The critical voltage effect in transmission electron microscopy. III. Influence of weak beams on degeneracy
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. The Critical Voltage Effect in Transmission Electron Microscopy. I. Eigenvalue Degeneracy in the Three-Beam Case
2. The critical voltage effect in transmission electron microscopy. II. A theoretical study neglecting absorption effects
3. Perturbation theory in transmission electron diffraction I. The perturbing matrix is constant and hermitian
4. Perturbation Theory in Transmission Electron Diffraction II. The Perturbing Matrix is Constant but not Hermitian
5. Thesis, University of Antwerp 1972.
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The Critical Voltage Effect in Transmission Electron Microscopy. X. Experimental Observatisons in the Presence of Non-Systematic Reflections;Physica Status Solidi (b);1978-06-01
2. The critical voltage effect in transmission electron microscopy. IX. The Calculation of Critical Voltages and Experimental Extinction Distances in Complicated Many-Beam Systems;Physica Status Solidi (b);1977-11-01
3. The Critical Voltage Effect in Transmission Electron Microscopy. VIII. The Qualitative Influence of Non-Systematic Reflections on the Critical Voltage;Physica Status Solidi (b);1977-04-01
4. Structure factor determination in α-ZrO2using the critical voltage effect. A comment;Acta Crystallographica Section A;1976-11-01
5. The Critical Voltage Effect in Transmission Electron Microscopy: VI. Renormalized Perturbation Theory for the Treatment of Absorption;physica status solidi (b);1976-03-01
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