Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Etude en microscopie electronique·de 1'influence des reflexions accidentelles sur les tensions critiques
2. The Critical Voltage Effect in Transmission Electron Microscopy. VIII. The Qualitative Influence of Non-Systematic Reflections on the Critical Voltage
3. David, M., van tendeloo, G., van Landuyt, J. and Gevers, R. 1977.Fifth International Conference on High- Voltage Electron Microscopy247 Kyoto, p.
4. Relativistic Hartree–Fock X-ray and electron scattering factors
5. Gjonnes, J., Andersson, B. and Rosen, B. 1974.International Conference on Crystallography298 Melbourne, p.
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