Etude en microscopie electronique·de 1'influence des reflexions accidentelles sur les tensions critiques-Reference-Cited by-同舟云学术

Etude en microscopie electronique·de 1'influence des reflexions accidentelles sur les tensions critiques

Published:1973-08 Issue:2 Volume:28 Page:447-463
ISSN:0031-8086
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Ayroles Par R.,Mazel A.,Ajustron F.

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786437308217465

Reference21 articles.

1. Vanishing Voltages of the Second Order Reflection in Electron Diffraction

2. Avroles, R., Mazel, A. and Ajustron, F. Proc. 5th Eitr. Congr. on Electron Microscopy. Manchester. pp.442

3. Scattering factors computed from relativistic Dirac–Slater wave functions

4. Relativistic Hartree–Fock X-ray and electron scattering factors

5. Fisher, R. M., Lally, J. S., Humphreys, C. J. and Metherell, A. J. F. 1970.Septième Conyrès International de Micmscopie EleclroniqueEdited by: Grenoble, Favard P. 107Paris

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multiple-beam dynamic effects in Kikuchi patterns obtained at very high voltages in electron microscopy;Philosophical Magazine A;1978-11

2. The Critical Voltage Effect in Transmission Electron Microscopy. X. Experimental Observatisons in the Presence of Non-Systematic Reflections;Physica Status Solidi (b);1978-06-01

3. Separation of the schrödinger equation in the dynamical theory of electron diffraction, in the case of systematic reflections;Radiation Effects;1978-01

4. A determination of the reflections required to describe electron diffraction phenomena in gold;Physica Status Solidi (a);1977-11-16

5. The Critical Voltage Effect in Transmission Electron Microscopy. VIII. The Qualitative Influence of Non-Systematic Reflections on the Critical Voltage;Physica Status Solidi (b);1977-04-01