Slow decay of a defect-related emission band at 2.05 eV in AlN: Signatures of oxygen-related DX states
Author:
Affiliation:
1. Institute of Quantum Matter/Semiconductor Physics Group, University of Ulm, Albert-Einstein-Allee 45; Ulm 89069 Germany
2. Department of Materials Science and Engineering, North Carolina State University, Raleigh; North Carolina 27606 USA
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference62 articles.
1. An aluminium nitride light-emitting diode with a wavelength of 210 nanometres
2. Milliwatt power deep ultraviolet light-emitting diodes over sapphire with emission at 278 nm
3. Improved Efficiency of 255–280 nm AlGaN-Based Light-Emitting Diodes
4. High-output-power 255/280/310 nm deep ultraviolet light-emitting diodes and their lifetime characteristics
5. 222-282 nm AlGaN and InAlGaN-based deep-UV LEDs fabricated on high-quality AlN on sapphire
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Combination of Ion Implantation and High‐Temperature Annealing: Donor–Acceptor Pairs in Carbon‐Implanted AlN;physica status solidi (a);2023-03-30
2. Photochromism and influence of point defect charge states on optical absorption in aluminum nitride (AlN);Journal of Applied Physics;2021-03-21
3. Donor-acceptor nature of orange photoluminescence in AlN;Semiconductor Science and Technology;2020-10-13
4. Below bandgap photoluminescence of an AlN crystal: Co-existence of two different charging states of a defect center;APL Materials;2020-08-01
5. Strain-free ultrathin AlN epilayers grown directly on sapphire by high-temperature molecular beam epitaxy;Applied Physics Letters;2020-04-13
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3