Tailoring the Thickness‐Dependent Optical Properties of Conducting Nitrides and Oxides for Epsilon‐Near‐Zero‐Enhanced Photonic Applications-Reference-Cited by-同舟云学术

Tailoring the Thickness‐Dependent Optical Properties of Conducting Nitrides and Oxides for Epsilon‐Near‐Zero‐Enhanced Photonic Applications

Published:2022-08-22 Issue: Volume: Page:2109546
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Advanced Materials

Author:

Saha Soham¹^ORCID,Ozlu Mustafa Goksu¹,Chowdhury Sarah N.¹,Diroll Benjamin T.²,Schaller Richard D.²,Kildishev Alexander¹,Boltasseva Alexandra¹³,Shalaev Vladimir M.¹³^ORCID

Affiliation:

1. School of Electrical and Computer Engineering Birck Nanotechnology Center Purdue University West Lafayette IN USA

2. Argonne National Laboratory Lemont IL 60439 USA

3. Purdue Quantum Science and Engineering Institute Purdue University West Lafayette IN USA

Funder

U.S. Department of Energy

Basic Energy Sciences

Office of Naval Research

Air Force Office of Scientific Research

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adma.202109546

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1. Optical Properties and Plasmonic Performance of Titanium Nitride

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5. Wide tuning of the optical and structural properties of alternative plasmonic materials

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