Non-contact evaluation of the electrical conductivity of thin metallic films by eddy current microscopy-Reference-Cited by-同舟云学术

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Non-contact evaluation of the electrical conductivity of thin metallic films by eddy current microscopy

Published:2012-04-18 Issue:9 Volume:44 Page:1294-1298
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Tohmyoh Hironori¹,Ishikawa Shoho¹,Muraoka Mikio²

Affiliation:

1. Department of Nanomechanics; Tohoku University; Aoba 6-6-01, Aramaki, Aoba-ku Sendai Japan

2. Department of Mechanical Engineering; Akita University; 1-1 Tegatagakuen-machi Akita Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.5005/fullpdf

Reference13 articles.

1. Self-assembled DNA networks and their electrical conductivity

2. Microscopic four-point atomic force microscope probe technique for local electrical conductivity measurement

3. Magnetization reversal and coercivity of magnetic-force microscopy tips

4. Mapping electron flow using magnetic force microscopy

5. Magnetic Field Observation around Current Path by Magnetic Force Microscopy

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4. Liftoff-Insensitive Conductivity Mapping Using a Self-Resonant Eddy-Current Probe;IEEE Transactions on Instrumentation and Measurement;2024

5. Mechanism of temperature influence in thickness measurement using eddy current sensors;2023 International Conference on Electronics and Devices, Computational Science (ICEDCS);2023-09-22

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