Mapping electron flow using magnetic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1573349
Reference22 articles.
1. Electromigration and IC Interconnects
2. Numerical simulation of electromigration‐induced shape changes of voids in bamboo lines
3. Simulations and theory of electromigration-induced slit formation in unpassivated single-crystal metal lines
4. Theoretical analysis of electromigration-induced failure of metallic thin films due to transgranular void propagation
5. Numerical simulation of current crowding phenomena and their effects on electromigration in very large scale integration interconnects
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1. Electrically assisted pulse forming using closed-loop force control;Journal of Manufacturing Processes;2021-11
2. Visualization of the electric current flowing through conducting structures via magnetic-force microscopy;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2015-09
3. Visualization of Electric Current Flow by Use of Magnetic Force Microscopy;Journal of Superconductivity and Novel Magnetism;2014-10-02
4. Imaging current paths in complex conductors by scanning fluorescence microscopy;Applied Physics Letters;2012-09-17
5. Non-contact evaluation of the electrical conductivity of thin metallic films by eddy current microscopy;Surface and Interface Analysis;2012-04-18
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