Thickness measurements on layered materials in powder form by means of XPS and ion sputtering
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference8 articles.
1. Surface sensitivity and angular dependence of X-ray photoelectron spectra
2. Instrumentation for surface studies: XPS angular distributions
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4. Quantitative surface measurements of metal oxide powders by X-ray photoelectron spectroscopy (XPS)
5. Surface analysis and angular distributions in x-ray photoelectron spectroscopy
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