Quantitative surface measurements of metal oxide powders by X-ray photoelectron spectroscopy (XPS)
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference14 articles.
1. Sensitivity of detection of the elements by photoelectron spectrometry
2. Relative intensities in x-ray photoelectron spectra
3. Relative photoelectron signal intensities obtained with a magnesium x-ray source
4. Experimental evaluation of a simple model for quantitative analysis in X-ray photoelectron spectroscopy
5. X-ray photoionization cross sections for quantitative analysis
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