Summary of ISO/TC 201 Technical Report: ISO/TR 19319: 2003—Surface chemical analysis—Auger electron spectroscopy and x-ray photoelectron spectroscopy—Determination of lateral resolution, analysis area and sample area viewed by the analyser-Reference-Cited by-同舟云学术

Summary of ISO/TC 201 Technical Report: ISO/TR 19319: 2003—Surface chemical analysis—Auger electron spectroscopy and x-ray photoelectron spectroscopy—Determination of lateral resolution, analysis area and sample area viewed by the analyser

Published:2004-07 Issue:7 Volume:36 Page:666-667
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Powell C. J.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam‐based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X‐ray photoelectron spectrometers (XPS);Surface and Interface Analysis;2021-10-22

2. Surface and Interface Characterization;Springer Handbook of Metrology and Testing;2011

3. Summary of ISO/TC 201 Standard: ISO 29081: 2010, surface chemical analysis-Auger electron spectroscopy-reporting of methods used for charge control and charge correction;Surface and Interface Analysis;2010-12-29

4. Summary of ISO/TC 201 Standard: XXX. ISO 18516: 2006-Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution;Surface and Interface Analysis;2008-02-13

5. Surface and Interface Characterization;Springer Handbook of Materials Measurement Methods;2006