Antisite Defect Si <sub>C</sub> as a Source of the D <sub> <i>I</i> </sub> Center in 4H‐SiC-Reference-Cited by-同舟云学术

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Antisite Defect Si _C as a Source of the D _I Center in 4H‐SiC

Published:2022-10-13 Issue:2 Volume:17 Page:2200239
ISSN:1862-6254
Container-title:physica status solidi (RRL) – Rapid Research Letters
language:en
Short-container-title:Physica Rapid Research Ltrs

Author:

Zhang Hai-Shan¹^ORCID,Gong Jian¹²,Shi Lin³

Affiliation:

1. School of Physical Science and Technology Inner Mongolia University Hohhot 010021 P. R. China

2. College of Physics and Electronic Information Inner Mongolia Normal University Hohhot 010021 P. R. China

3. School of Materials Science and Engineering Yancheng Institute of Technology Yancheng 224051 P. R. China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssr.202200239

Reference41 articles.

1. Ultrahigh-quality silicon carbide single crystals

2. Overview of Silicon Carbide Technology: Device, Converter, System, and Application

3. Material science and device physics in SiC technology for high-voltage power devices

4. Negative-Ucenters in 4Hsilicon carbide

5. Stability of deep centers in 4H-SiC epitaxial layers during thermal annealing

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electrical Conductivity Improvement of Point Defects in 4H-SiC;Crystal Growth & Design;2023-07-28

2. IBIL Measurement and Optical Simulation of the DI Center in 4H-SiC;Materials;2023-04-06

3. Imperfections are not 0 K: free energy of point defects in crystals;Chemical Society Reviews;2023

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